Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

AFM facilitates atomic resolution imaging of insulator and conductor surfaces. One of the techniques utilizing AFM is frequency-modulation AFM (FM-AFM), which has been used for the atomic-resolution ...

AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

SEOUL, Korea – February 19, 2025 – Park Systems, a global leader in atomic force microscopy (AFM), has unveiled an expanded ...