Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

Scientists at the Center for Functional Nanomaterials used transmission electron microscopy to analyze the elemental makeup of materials comprising quantum devices. The above image shows that there is ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

Working on the nanoscale for manufacturing poses some unique challenges. While many macroscale manufacturing methods such as lithography and additive manufacturing have been successfully translated ...

Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

To ensure that the tissue structures of biological samples are easily recognizable under the electron microscope, they are ...

The global transmission electron microscope market is rapidly expanding due to the increasing demand for analytical and structural characterization of nanostructured materials and is projected to ...