With the “titron,” BAUR Prüf- und Messtechnik GmbH presents a new, automatic cable test van. Its modern equipment and innovative operational concept make fault location on one- to three-phase cable ...
The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...
The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...
Robust, readily portable and easy to use, the SebaKMT HVB10 high-voltage bridge from Megger allows cable and sheath faults in power cables to be prelocated reliably and accurately, even in difficult ...
The 2002 NEC implemented new requirements to help reduce the number of electrical fires caused by parallel arc faults in branch circuit wiring. All branch circuits supplying bedrooms in single-family ...
EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...
Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...
Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...
New non-volatile memories (NVM) bring new opportunities for changing how we use memory in systems-on-chip (SoCs), but they also add new challenges for making sure they will work as expected. These new ...
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