Business Wire

Hprobe Receives Order from a Tier-1 Semiconductor Manufacturer for a Wafer-Level Magnetic Tester to be Used for Strategic R&D of Magnetic Materials and Devices

GRENOBLE, France--(BUSINESS WIRE)--Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a significant order from a tier-1 semiconductor ...
Business Wire

Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production

GRENOBLE, France--(BUSINESS WIRE)--Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing ...
Semiconductor Engineering

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it’s not a simple technology to work with. Several chipmakers are ramping up a next-generation memory type called STT-MRAM, but there ...
MD&M East

Magnetic Test Could Help Improve Reliability of Medical Electronic Devices

The magnetically actuated peel test developed by Georgia Tech researchers tests the stresses to which microelectronic chips are subjected. (Image courtesy of Greg Ostrowicki and Suresh Sitaraman) ...
Science Daily

Tests show high-temperature superconducting magnets are ready for fusion

A comprehensive study of high-temperature superconducting magnets confirms they meet requirements for an economic, compact fusion power plant. In the predawn hours of Sept. 5, 2021, engineers achieved ...