Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Microscopy continues to transform the life sciences. Here are five recent breakthroughs made possible by the technique.

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

Rapid 3D image acquisition technique, without moving observation plane, developed by Tohoku and Osaka universities. Conceptual illustration of the “One-scan” microscopy method. A newly-proposed 3D ...