A new computational framework maps 3D atomic positions in amorphous materials, achieving full accuracy for silica using simulated electron microscopy data.

Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the three-dimensional positions and elemental identities of atoms in amorphous materials.

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

(Background) A false-colored scanning electron microscope image of zinc oxide (ZnO) nanowires coated with titanium dioxide, or titania (TiO2). On average, the nanowires are 10 times longer than they ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...